ICT/FCT TEST PROBES
During in-circuit tests (ICT) all components on the PCB are measured. In doing so, defective components are detected and can be replaced accordingly.
Function tests (FCT) check the entire intended function of a PCB. According to the intended area of use, the environment is replicated and the electrical performance of the PCB is checked.
In order to optimally fulfill the contacting requirements, various test probes are available. These differ in terms of installation height, grid size (possible distance between probes),
tip style, and type of connection – see following illustration.
The electrical connection is achieved either with a solder cup
or wire-wrap, with or without cable (wireless).
ICT/FCT Test Probes
International Standard Spring Loaded Test Probes (GKS)
Available in two different versions: Standard working stroke (4.3 mm) and longer working stroke (9.3 mm) for dual- stage test fixtures to combine ICT and FCT. Wireless receptacles enable the wireless connection of test probes using a transfer PCB.
Short / robust test probes
Stand out due to their robust, compact design.
INGUN E-TYPE® test probes
Have a higher preload in comparison to standard test probes. This initial higher spring force
guarantees a secure contact at the same final load (the spring force is equal to that of the comparable standard test probe at working stroke).
Rotating test probes
Can provide a reliable alternative if contacting problems occur. A rotating movement during the
stroke process scratches the surface to be contacted, thus insulating layers are securely penetrated.
Bead test probes
Are used to contact beads on PCBs. A variety of tip styles are available depending on the beads
Fine pitch test probes
Are used to contact very small test points in small grids. These are sometimes mounted without
receptacles.
Metric test probes (metric standard)
In addition to the classic ICT/FCT test probes without collars, the metric standard test probes stand out due to their stability and robustness and all feature a pronounced collar.
ICT/FCT Overview and Comparison of Test Probes
